Analytical equipment
Elemental analysis
Elemental analyzer for quantitative dosage of C, H, N and S elements (Flash 2000 de Thermo Scientific)
Flash 2000 apparatus from ThermoFisher Scientific for the simultaneous analysis of carbon, nitrogen, oxygen and sulfur in 1 mg of solid or liquid sample. Sample are analysed two times.
Principle
The sample (1 mg – microgramme precision) is pyrolize under oxygen at 960°C.
Nitrogen, carbon, hydrogen and sulphur are, by a succession of reactions, oxidized in carbon dioxide, water, dinitrogen and sulphur dioxide. These gases are then separated by column chromatography, detected by a cathetometer and quantified by integration of the resulting peak from the conduction variation of the so-called cathetometer.
The viability of the result is established at the end of the analysis by a standard.
On stable and clean products, the percentage given by the analyser is more or less 0.4% of the calculated pourcentages. (absolute accuracy = 0.2 %).
Staff:
Denis LOQUET
Office 123
Phone: +332 51 12 57 13
Link
Method: Particle size analysis using dynamic light scattering (DLS) (CPER CISPEO)
Device: Cordouan VascoKin™
170° back-scattering working mode, volume range 50 µL-4 mL
Accessories:
- 659 nm excitation laser diode head
- APD detection (dead time 35 ns, pulse width 14 ns, afterpulse < 1%)
- Tête de mesure déportée
- Gamme de tailles : 0,5 nm à 10 um
- Concentration : 1.10-5 à 40 % massique
- Résolution temporelle : 200 ms
Atomic Absorption Spectroscopy
Atomic Absorption Spectrometer THERMO SCIENTIFIC ICE 3300
Flame "Air/Acetylene" or "Nitrous Oxyde/Acetylene"
Analysis with Flame Air/Acetylene:
Li, Na, Mg, K, Ca, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, Rb, Sr, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb, Te, Cs, Ba, Ir, Pt, Au, Hg, Tl, Pb, Bi.
Available lamps in the lab : Pb, Fe/Ni, Na/K, Ca/Si, Cd/Zn, Mg, Ag, Ga, Sn, Cu and Pd.
Analysis with Flame Nitrous oxide /Acetylene :
Be, B, Al, Si, P, Ca, Sc, Ti, V, Cr, Ga, Ge, As, Se, Sr, Y, Zr, Nb, Mo, Rh, Sn, Ba, La, Hf, Ta, W, Re, Os, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Th, U.
Available lamps in the lab : Ca/Si, Ga, Sn, Gd, As, P, Ho, Ti, Zr and Pt.
Atomic force microscope
Operation CPER "CEISAM Atomic Force Microscope" of the CISPEO project is cofunded by the European Union through the funds of the region Pays de la Loire (FEDER) .
ATOMIC FORCE MICROSCOPE JPK NanoWizard®4 combined with NIKON Ti2-U inverted optical microscope
Measuring mode :
- Contact.
- Dynamic.
- Force Modulation (QI Advanced TM mode).
- Kelvin Probe Force Microscopy (KPM mode).
Sample holder :
- Temperature module (-30°C to +120°C +/- 0.1°C) designed for opaque samples (JPK HCM TM ). Sample size : 15x15 mm. .
- Temperature module (RT to +60°C +/- 0.1°C) designed for transparent samples (PetriDishHeater TM ). Compatible with 35 mm Petri dishes.
Inverted Microscope :
Objective:
- Nikon CFI S P-Fluor ELWD 60xC/ 0.95/WD : 0,21-0,11mm.
- Nikon CFI S P-Fluor ELWD 40xC/ 0.95/ WD : 0,25-0,16mm.
- Nikon CFI Plan Apochromat Lambda 20X/ 0.75/ 1,00 mm.
LED Source.
Fluorescence filters :
- DAPI-50LP-A.
- FITC-3540C.
- Cy3-4040C.
- Cy5-4040C.
Isolation:
JPK acoustic enclosure with Accurion's Halcyonics i4 acitve vibration isolation system.
- Cy3-4040C.
- Cy5-4040C.
operation
Le microscope à Force Atomique est adapté aux échantillons inorganiques - organiques - biologiques sous air ou en milieu liquide.
Les mesures sont réalisées par François-Xavier LEFEVRE.
Staff
François-Xavier LEFEVRE
Office 240
Phone: +332 51 12 54 05
Link